这个分析的起因，是由于我之前干了这两个事：
[troubleshoot][archlinux][bcache] 修改linux文件系统 / 分区方案 / 做混合硬盘 / 系统转生大！手！术！（调整底层架构，不！重！装！）
[archlinux][hardware] 查看SSD的使用寿命
在１２月０６日完成了底层硬盘的调整之后，做了如下的硬盘指标统计：
/home/tong/Workspace/system/bcache [tong@T7] [17:18] > cat 20161206 smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.8.11-1-ARCH] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SanDisk based SSDs Device Model: SanDisk SSD U110 16GB Serial Number: 153486400725 LU WWN Device Id: 5 001b44 ec81598d5 Firmware Version: U21B001 User Capacity: 16,013,942,784 bytes [16.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 1.8 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Dec 6 20:03:00 2016 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x51) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 3) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O---- 100 100 000 - 0 9 Power_On_Hours -O---- 100 100 000 - 2199 12 Power_Cycle_Count -O---- 100 100 000 - 693 171 Program_Fail_Count -O---- 100 100 000 - 0 172 Erase_Fail_Count -O---- 100 100 000 - 0 173 Avg_Write/Erase_Count -O---- 100 100 000 - 45 174 Unexpect_Power_Loss_Ct -O---- 100 100 000 - 56 187 Reported_Uncorrect -O---- 100 100 000 - 0 230 Perc_Write/Erase_Count -O---- 100 100 000 - 150 232 Perc_Avail_Resrvd_Space PO---- 100 100 005 - 0 234 Perc_Write/Erase_Ct_BC -O---- 100 100 000 - 111 241 Total_LBAs_Written -O---- 100 100 000 - 538537024 242 Total_LBAs_Read -O---- 100 100 000 - 1275507679 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 GPL,SL R/O 1 SMART self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 SATA NCQ Queued Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 1 Device vendor specific log 0xa2 GPL,SL VS 2 Device vendor specific log 0xa3 GPL,SL VS 1 Device vendor specific log 0xa6-0xa7 GPL,SL VS 255 Device vendor specific log Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum. SMART Extended Comprehensive Error Log Version: 1 (16 sectors) No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 65535 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 18446744073709551615 18446744073709551615 Not_testing 2 18446744073709551615 18446744073709551615 Not_testing 3 18446744073709551615 18446744073709551615 Not_testing 4 18446744073709551615 18446744073709551615 Not_testing 5 18446744073709551615 18446744073709551615 Not_testing 65535 18446744073709551615 65534 Read_scanning was never started Selective self-test flags (0xffff): Currently read-scanning the remainder of the disk. If Selective self-test is pending on power-up, resume after 65535 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 42 --- Current Temperature 0x05 0x010 1 - --- Average Short Term Temperature 0x05 0x018 1 - --- Average Long Term Temperature 0x05 0x020 1 54 --- Highest Temperature 0x05 0x028 1 25 --- Lowest Temperature 0x05 0x030 1 46 --- Highest Average Short Term Temperature 0x05 0x038 1 46 --- Lowest Average Short Term Temperature 0x05 0x040 1 - --- Highest Average Long Term Temperature 0x05 0x048 1 - --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 95 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 1 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 5 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0001 2 0 Command failed due to ICRC error /home/tong/Workspace/system/bcache [tong@T7] [17:18] >
在１２月１９日再次进行了硬盘指标的统计：
/home/tong/Workspace/system/bcache [tong@T7] [17:20] > cat 20161219 smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.8.13-1-ARCH] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SanDisk based SSDs Device Model: SanDisk SSD U110 16GB Serial Number: 153486400725 LU WWN Device Id: 5 001b44 ec81598d5 Firmware Version: U21B001 User Capacity: 16,013,942,784 bytes [16.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 1.8 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon Dec 19 16:51:12 2016 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x51) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 3) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O---- 100 100 000 - 0 9 Power_On_Hours -O---- 100 100 000 - 2351 12 Power_Cycle_Count -O---- 100 100 000 - 707 171 Program_Fail_Count -O---- 100 100 000 - 0 172 Erase_Fail_Count -O---- 100 100 000 - 0 173 Avg_Write/Erase_Count -O---- 100 100 000 - 61 174 Unexpect_Power_Loss_Ct -O---- 100 100 000 - 56 187 Reported_Uncorrect -O---- 100 100 000 - 0 230 Perc_Write/Erase_Count -O---- 100 100 000 - 203 232 Perc_Avail_Resrvd_Space PO---- 100 100 005 - 0 234 Perc_Write/Erase_Ct_BC -O---- 100 100 000 - 120 241 Total_LBAs_Written -O---- 100 100 000 - 598719455 242 Total_LBAs_Read -O---- 100 100 000 - 1338182982 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 GPL,SL R/O 1 SMART self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 SATA NCQ Queued Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 1 Device vendor specific log 0xa2 GPL,SL VS 2 Device vendor specific log 0xa3 GPL,SL VS 1 Device vendor specific log 0xa6-0xa7 GPL,SL VS 255 Device vendor specific log Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum. SMART Extended Comprehensive Error Log Version: 1 (16 sectors) No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 65535 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 18446744073709551615 18446744073709551615 Not_testing 2 18446744073709551615 18446744073709551615 Not_testing 3 18446744073709551615 18446744073709551615 Not_testing 4 18446744073709551615 18446744073709551615 Not_testing 5 18446744073709551615 18446744073709551615 Not_testing 65535 18446744073709551615 65534 Read_scanning was never started Selective self-test flags (0xffff): Currently read-scanning the remainder of the disk. If Selective self-test is pending on power-up, resume after 65535 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 49 --- Current Temperature 0x05 0x010 1 - --- Average Short Term Temperature 0x05 0x018 1 - --- Average Long Term Temperature 0x05 0x020 1 54 --- Highest Temperature 0x05 0x028 1 25 --- Lowest Temperature 0x05 0x030 1 46 --- Highest Average Short Term Temperature 0x05 0x038 1 46 --- Lowest Average Short Term Temperature 0x05 0x040 1 - --- Highest Average Long Term Temperature 0x05 0x048 1 - --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 95 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 2 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 5 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0001 2 0 Command failed due to ICRC error /home/tong/Workspace/system/bcache [tong@T7] [17:20] >
比较如下：
/home/tong/Workspace/system/bcache [tong@T7] [17:20] > diff 20161206 20161219 1c1 < smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.8.11-1-ARCH] (local build) --- > smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.8.13-1-ARCH] (local build) 17c17 < Local Time is: Tue Dec 6 20:03:00 2016 CST --- > Local Time is: Mon Dec 19 16:51:12 2016 CST 62,63c62,63 < 9 Power_On_Hours -O---- 100 100 000 - 2199 < 12 Power_Cycle_Count -O---- 100 100 000 - 693 --- > 9 Power_On_Hours -O---- 100 100 000 - 2351 > 12 Power_Cycle_Count -O---- 100 100 000 - 707 66c66 < 173 Avg_Write/Erase_Count -O---- 100 100 000 - 45 --- > 173 Avg_Write/Erase_Count -O---- 100 100 000 - 61 69c69 < 230 Perc_Write/Erase_Count -O---- 100 100 000 - 150 --- > 230 Perc_Write/Erase_Count -O---- 100 100 000 - 203 71,73c71,73 < 234 Perc_Write/Erase_Ct_BC -O---- 100 100 000 - 111 < 241 Total_LBAs_Written -O---- 100 100 000 - 538537024 < 242 Total_LBAs_Read -O---- 100 100 000 - 1275507679 --- > 234 Perc_Write/Erase_Ct_BC -O---- 100 100 000 - 120 > 241 Total_LBAs_Written -O---- 100 100 000 - 598719455 > 242 Total_LBAs_Read -O---- 100 100 000 - 1338182982 126c126 < 0x05 0x008 1 42 --- Current Temperature --- > 0x05 0x008 1 49 --- Current Temperature 140c140 < 0x07 0x008 1 1 N-- Percentage Used Endurance Indicator --- > 0x07 0x008 1 2 N-- Percentage Used Endurance Indicator /home/tong/Workspace/system/bcache [tong@T7] [17:21] >
关键指标红色标出。
从去年大概１０月底新机初装开始，到１２月０６日，寿命禁用了１％。从１２月０６至１９日短短１３天，寿命值便增长为２％。
已知假设常规使用的情况下一块ＳＳＤ的寿命是１０年，计算如下：
/home/tong/Workspace/system/bcache [tong@T7] [16:53] > bc -l bc 1.06.95 Copyright 1991-1994, 1997, 1998, 2000, 2004, 2006 Free Software Foundation, Inc. This is free software with ABSOLUTELY NO WARRANTY. For details type `warranty'. 538537024 / 365 ＃ 取整之前常规使用情况下，的使用时长为３６５天。 1475443.90136986301369863013 ＃ 计算平均每天的写入次数。 (598719455 - 538537024) / 13 4629417.76923076923076923076 ＃ 计算过去的１３天里，评价每天的写入次数。 10 / 4 ＃ 两种情况下的单天写入次数取比例。 2.5000000000000000000
基于以上计算，采用ｂｃａｃｈｅ模式使用ＳＳＤ硬盘的情况下，硬盘的写入次数是常规情况下的４倍。
按照常规经验值１０年计算，ｂｃａｃｈｅ方式下ＳＳＤ的寿命为１０年的四分之一：２．５年。
我只为ｂｃａｃｈｅ分配了１６ＧＳＳＤ的一半８ＧＢ。又因为ｂｃａｃｈｅ方式下，ＳＳＤ的缓存为 ＬＲＵ方式。所以，如果采用１６ＧＢ的话，缓存内容会加倍，读写次数自然也会加倍。这样的话寿命将缩短为１．２５年，这与百合的经验也完全相符，它的ＳＳＤ就是一年之后坏掉的。
所以基于以上，我的这块ＳＳＤ，将于２０１９年６月前坏掉。
淘宝上１６Ｇ二手ｎｇｆｆＳＳＤ的售价是３５。全新６４Ｇ也不过１５０。
我决定将这块ＳＳＤ作为耗材继续使用。完。：）
当然，后续我还会定期观察。随时更新信息。
==================== update @ 20170624 ========================
smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.11.6-1-ARCH] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SanDisk based SSDs Device Model: SanDisk SSD U110 16GB Serial Number: 153486400725 LU WWN Device Id: 5 001b44 ec81598d5 Firmware Version: U21B001 User Capacity: 16,013,942,784 bytes [16.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 1.8 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sat Jun 24 19:54:15 2017 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x51) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 3) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O---- 100 100 000 - 0 9 Power_On_Hours -O---- 100 100 000 - 3738 12 Power_Cycle_Count -O---- 100 100 000 - 915 171 Program_Fail_Count -O---- 100 100 000 - 0 172 Erase_Fail_Count -O---- 100 100 000 - 0 173 Avg_Write/Erase_Count -O---- 100 100 000 - 700 174 Unexpect_Power_Loss_Ct -O---- 100 100 000 - 62 187 Reported_Uncorrect -O---- 100 100 000 - 0 230 Perc_Write/Erase_Count -O---- 100 100 000 - 2333 232 Perc_Avail_Resrvd_Space PO---- 100 100 005 - 0 234 Perc_Write/Erase_Ct_BC -O---- 100 100 000 - 367 241 Total_LBAs_Written -O---- 100 100 000 - 1250863844 242 Total_LBAs_Read -O---- 100 100 000 - 2187069727 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 GPL,SL R/O 1 SMART self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 SATA NCQ Queued Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 1 Device vendor specific log 0xa2 GPL,SL VS 2 Device vendor specific log 0xa3 GPL,SL VS 1 Device vendor specific log 0xa6-0xa7 GPL,SL VS 255 Device vendor specific log Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum. SMART Extended Comprehensive Error Log Version: 1 (16 sectors) No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 65535 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 18446744073709551615 18446744073709551615 Not_testing 2 18446744073709551615 18446744073709551615 Not_testing 3 18446744073709551615 18446744073709551615 Not_testing 4 18446744073709551615 18446744073709551615 Not_testing 5 18446744073709551615 18446744073709551615 Not_testing 65535 18446744073709551615 65534 Read_scanning was never started Selective self-test flags (0xffff): Currently read-scanning the remainder of the disk. If Selective self-test is pending on power-up, resume after 65535 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 46 --- Current Temperature 0x05 0x010 1 - --- Average Short Term Temperature 0x05 0x018 1 - --- Average Long Term Temperature 0x05 0x020 1 54 --- Highest Temperature 0x05 0x028 1 25 --- Lowest Temperature 0x05 0x030 1 46 --- Highest Average Short Term Temperature 0x05 0x038 1 46 --- Lowest Average Short Term Temperature 0x05 0x040 1 - --- Highest Average Long Term Temperature 0x05 0x048 1 - --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 95 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 23 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 5 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0001 2 0 Command failed due to ICRC error
当前的寿命为23%， 与之前的估算出入不大，寿命大概会在19年春天达到100%。