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  • 可测性设计:关于Rombist

    关于EmbeddedMemories

    •   随着半导体工艺的发展,可测性技术(DFT)成为每个芯片在设计中必须考虑的问题
    •   如何高效和高质量的测试芯片中的内嵌Memory,成为DFT技术中的关键技术
    •  本文针对rombist中的Memorymodel的产生算法和结果做一个分析和总结
    •   实际案例的具体分析和计算
    •   希望对大家的面试和工作有帮助

    MBIST Architect Architecture

    •   General Memory bist structure :

    When Should we Use Memory BIST?

    •   User should use Memory BIST:
    •      On medium to large embedded memories
    •      On memories that are contained within Intellectual Property (IP)that will be reused
    •      On memories that should be tested at speed
    •      On devices with multiple embedded memories
    •      On devices that are time-to-market critical
    •      On devices that run on ATEs with limited capability
    •      On SoCs where testing and verification will be difficult

    Advantages of Adding BIST

    •    Enables Intellectual Property (IP) reuse
    •    Reduces test application time and simplifies pattern generation
    •    Reduces amount of test data to store
    •    Facilitates hierarchical test capabilities -- lets you easily testat model, block, design, and system levels
    •    Merges test and design, reducing development time
    •    BIST controller can be shared across memories

    Disadvantages of Adding BIST

    •    Small area increase
    •    Adds Mux delay to memory data path
    •    Not as flexible as direct access testing
    •    Small routing and timing impact

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  • 原文地址:https://www.cnblogs.com/xgcl-wei/p/9048270.html
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